|
性能参数
|
|
Measurement system
|
THz-TDS (Time-Domain Spectroscopy)
|
|
Measurement signal
|
Time waveform of the electric field strength
|
|
Output data
|
Transmission/reflection spectrum (option), Complex Refractive Index and Complex ielectric Constant(analysis program use)
|
|
Sample chamber optical arrangement
|
Transmission optical system arrangement arrangement with an optical system attachment (option), general - purpose measurement such as reflection and ATR measurement can be made.Variable temperature measurement with cryostat(optional) can be made.
|
|
Sample chamber capacity
|
200 (w) x360(D)x200 (H) mm, approximately 14L
|
|
Measurement zone
|
40 GHz - 4 THz or greater (cut-off frequency)
|
|
Spectral resolution
|
7 GHz or less
|
|
Dynamic range
|
50 dB or greater (power spectrum: Maximum)
|
|
Signal-noise ratio
|
2500: 1 or greater (power spectrum: Maximum)
|
|
femto- second pulsed laser
|
Central wavelength near 780 -800 nm, pulse width less than 100 fs,power greater than 0.5nJ/pulse and frequency greater than 40 MHz(*an external laser source can be used)
|
|
Sample form
|
Solid samples, liquid samples (requires a liquid cell)
|
|
PC requirements
|
PC compatible with Windows 7 (32bit edition) The PC (above) requires one wired LAN and one USB for connection to the Tera Prospector.
|
|
Software
|
Measurement Software and Analysis Software
|
|
Dimensions/Weight
|
700 (w) x580(D)x380 (H) mm, approximately 60 kg.(*excluding wiring and protrusions etc.)
|
|
Power source
|
AC100 V(50/60 Hz)10 A
|
满足多用途使用。该系统扩展了一个外部激光输入口，当用户已购买激光器时，该系统可不配置激光器，满足用户多用途使用。
良好的系统可扩展性。光谱仪不仅用于透射/反射测量; 它也可以与其他可选配件一起使用，如测绘等。同时可使用加热/冷却附件进行与温度相关的测量。
高阻硅片测试结果
分子支链太赫兹吸收光谱
树脂材料透射测试